Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Capacitance-Voltage (C-V) measurements are widely used to measure semiconductor parameters, especially for MOS CAP and MOSFET structures.The capacitance of a MOS (Metal-Oxide-Semiconductor) structure is a function of the applied voltage, and the curve of the MOS capacitance as a function of the applied voltage is called the C-V curve (referred to as the C-V characteristic), and the C-V curve test is used to conveniently determine the thickness of the silica layer, dox, The C-V curve test can easily determine the thickness of the silica layer, dox, the doping concentration of the substrate, N, the movable charge surface density Q1 in the oxide layer, and the fixed charge surface density Qfc.
Software Interface and Functions
CV test interface
CV curve diagram
| module (in software) | VGS Range | IGSS/IGE | VDS range | IDSS/ICES | Source Measurement Accuracy |
|---|---|---|---|---|---|
| SMU | 0 - ±30V (optional) | ≥10pA (optional) | 0-±300 | ≥10pA | 0.03% |
| 0-±1200V | ≥1nA | 0.1% | |||
| 0-±2200V | ≥1nA | 0.1% | |||
| 0-±3500V | ≥1nA | 0.1% |
| module (in software) | Test Frequency | Frequency output accuracy | Fundamental Accuracy | AC test signal alignment | DC test signal alignment | Output Impedance | Measurement range |
|---|---|---|---|---|---|---|---|
| LCR | 10Hz-1MHz | ±0.01% | ±0.05% | 10mV to 2Vrms
(1m Vrms resolution) |
10mV to 2V
(1m Vrms resolution) |
100Ω | |Z|, R, X
0.001mΩ-99.999MΩ Cs, Cp 0.01pF - 9.9999F D 0.00001-9.999 DCR 0.001mΩ-9.999MΩ θ -180° -+180° |Y|, G, B 0.1nS-99.999S Ls Lp 0.1nH-9.999kH Q 0.1-9999.9 Δ% -9999%-999% |
*The above specifications are subject to update without prior notice.
● Wide frequency range: frequency range 10Hz ~ 1MHz continuous frequency point adjustable
● High accuracy and large dynamic range: provide 0V~3500V bias voltage range, accuracy 0.1%
● Built-in CV test: Built-in automated CV test software, including C-V (capacitance-voltage), C-T (capacitance-time), C-F (capacitance-frequency) and other test test functions.
IV-compatible testing: Supports both breakdown and leakage current characterization.
● Real-time curve plotting: the software interface intuitively shows the project test data and curves for easy monitoring.
:: Highly scalable: the system is modularized and can be flexibly matched according to needs
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