Photovoltaic ZC1608 Multi-Circuit Potential Difference Induced Decay (PID) Test System

PID effect (Potential Induced Degradation), also known as Potential Induced Degradation (PID), is a phenomenon in which the encapsulation material of the battery module and the materials on its upper and lower surfaces, and the ionic migration under the action of the high voltage between the cell and its grounded metal frame, cause the performance of the module to decay. This system ensures that the module alarms after reaching a certain level of performance decay by monitoring its leakage current over a long period of time, testing the service life level of the module so that it can ensure the safe operation of the network.The test standard of PID is based on the combination of the IEC62804 PV Module Performance Test Standard, the IEC61215, and the IEC61730 PV Module Safety Test Standard.