DC Overlap Test System Model 11300

The Chroma 11300 DC Overlap Test System is a combined test system containing an LCR meter and a DC overlap current source.

This DC Overlap Test System integrates the 3252/3302 series automatic parts analyzer, 1320 series DC Overlap Current Source, and other major hardware test equipment. 3252/3302 series automatic parts analyzer can directly control the output of 1320 series DC Overlap Current Source. A wide range of test specifications, up to 300A DC overlap, to meet the test needs of different applications such as RD, QC, QA, etc., providing cost-effective procurement options.

The system is designed for large DC currents up to 300 A. The connection between DC overlapping current sources is designed with low ESR (<10m ohm) to minimize heat generation and improve the accuracy of measurement results. With multifunctional four-terminal test fixtures, it is possible to measure a variety of DUTs, including SMD DUTs, DIP ring core DUTs, and so on.

This system can provide Power Choke scanning characterization graphs through the online software of Windows operating environment or the scanning function of the LCR table itself. The Chroma 11300 is the best test solution for magnetic chokes and cores of all kinds of power supplies, providing manual triggering or automatic triggering of multi-point scanning DC overlap to analyze the core characteristics, including inductance quality review and product functionality analysis.

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