Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
■ The new form-factor interface design and operation style are perfectly presented on the 4.3-inch TFT. This transformer test system provides 20Hz-200kHz test frequency, which meets the customer's measurement needs for switching transformers, network transformers and so on. The transformer scanning test covers a variety of low-voltage parameters of the transformer, and also provides a record and view of the number of times the relay of the scanning fixture has been used, so that the customer can have a comprehensive grasp of the status of the use of the relay and replace it in a timely manner.
| Product Model | TH2832XB 变压器测试系统 | ||
| Transformer test parameters | Turn Ratio, Number of Turns, Phase, Inductance, Capacitance, Leakage Inductance, Quality Factor, AC Resistance, DC Resistance, Balance, Pin Short. | ||
| Fundamental Accuracy | LCRZ | 0.1% | |
| DCR, Turn Ratio | 0.5% | ||
| 测试信号频率点 | 20Hz-200kHz 共15025 | ||
| Signal source output impedance | 30Ω, 100Ω selectable | ||
|
AC Test Signal Level |
normalcy | 10mV-2Vrms | Minimum resolution: 10mV, accuracy: 10%x set voltage +2mV |
| 100μA-20mArms | Minimum resolution: 0.1mA | ||
| constant level | 20mV-1Vrms | Minimum resolution: 10mV, accuracy: 10%x set voltage +2mV | |
| 200μA-10mArms | Minimum resolution: 0.1mA | ||
| DC bias voltage source | 0V-± 5V | 最小分辨率：0.5mV,准确度：1%x设定电压+5mV | |
| 0mA-±50mA | Minimum resolution: 0.5μA | ||
| DCR Display Range | 0.00001Ω-999.999MΩ | ||
| Lap ratio display range | 1:0.01-100:1 | ||
| Measurement time (≥10 kHz) | Fast: 25 times/second (40ms), Medium: 8 times/second (125ms) Slow: 2.7 times/second (370ms) | ||
| equivalent circuit | Series, Parallel | ||
| Measurement range | Automatic, Hold | ||
| trigger method | Internal, Manual, External, Bus | ||
| Average number of times | 1-255 | ||
| zeroing function | Open, Short, Load | ||
| mathematical operation | Direct Reading,ΔABS,Δ% | ||
| Trigger delay time setting | 0-60.000s,1ms steps | ||
| Step delay time setting | 0-60.000s,1ms steps | ||
| Comparator Functions | 10-speed binning, BIN1 to BIN9, NG, AUX | ||
| stall counting function | |||
| PASS, FAIL front panel or scanning fixture LED display | |||
| memory (unit) | 100 sets of LCRZ instrument setting file memory 100 sets of transformer scanning setting file memory | ||
| connector | control interface | HANDLER or SCANNER | |
| communication interface | USB HOST, RS232C, RS485 (option), GPIB (option) | ||
| memory interface | USBDEVICE | ||
| TH1831 Scanning Test Fixture Technical Parameters | |||
| Scan Test Output Pin | 24Pin | ||
| 24 Pin Scanning Output Distribution Capacitance | 20pF | ||
| Transformer locking method (option) | Pneumatic (TH1831-02) Maximum support 0.7MPa | ||
| Manual (TH1831-01) | |||
| Panel Test Control | START, RESET button, PASS/FAIL LED indication | ||
| Handler interface (output from scanning fixture) Input/output signals | 电源：+5V，GND 输入：START，RESET 输出：PASS，FAIL 通、断信号TTL电平 | ||
| External startup input | Foot-activated switch | ||
| Operating Temperature, Humidity | 0°C-40°C, ≤90%RH | ||
| Solenoid valve operating power output | +24V | ||
| volumetric | 228mm×203mm×53mm | ||
| weights | 2.9kg | ||
■ 200kHz最高频率，不含独立LCR功能
■ Built-in 0-50mA/0-5V bias power supply
■ Discrete Passive Component (L, R, C) Multi-Scan Testing
■ Multi-scan testing of relay driver packages, contact contact resistance
■ Multiple DC resistance DCR scan test
■ Comprehensive test analysis of multiple passive components in impedance networks
■ TH2832XA: LCR + Transformer Test System
TH2832XB: Transformer Test System
TH2832XC: Transformer Test System
■ 4.3-inch TFT LCD display with 272 x 480 resolution
■ New interface design
■ Switching transformer scanning tests, comprehensive characterization
■ Network transformer scanning tests, comprehensive characterization
■ Alternate DCR test signals
■ Provide single-parameter test cycles to test and judge individual windings
Adaptation of the TH1831 24Pin Transformer Scanning Fixture
■ 扫描治具继电器动作次数查看，以便客户对继电器使用状况
的掌握
■ Scanning fixture relay self-test function, to ensure the reliable operation of the scanning fixture
▪ Flexible deviation deductions
■ Parameter setting file compatible with TH2829X-24
■ Save test data or images in CSV, GIF format to USB memory.
■ The instrument can save 100 sets of setting files internally, and a large number of U disk setting files can be saved.
■ Support U disk software online upgrade mode
■ Provide PC-level instrument test setup file programming capability (optional)
■ RS-232, USB DEVICE and other interfaces to support host computer communication
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