TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source
TH1779 DC Bias Current Source

TH1779 DC Bias Current Source

- Single 0-50A constant current output, can be used as master or slave

- Support up to 8 sets of on-line, maximum 400A constant current output

- Master/slave control mode, flexible tailorability and scalability

- Fine current stepping

- 0Hz-2MHz frequency response

- Two types of current outputs: single current and step scanning

- Graphical operation, Chinese and English interface

- Directly controlled by TH2851/TH2848/TH2840/TH2836/TH2839/TH2838 series

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With its deep technical accumulation and extensive market research in the field of bias current source, Tonghui Electronics has launched a high power DC bias current source-TH1779 series DC bias current source.

TH1779 DC bias current source adopts high-performance microprocessor, can provide single 0.1-50A constant current output, and can be master-slave mode parallel to enhance the maximum output current to 0.1-300A, with excellent tailorability and scalability.

TH1779 DC bias current source adopts a new generation of AC/DC superposition test principle, adapting to high precision and high frequency test requirements. Built-in high-performance embedded MCU can quickly respond to the status or failure of the master and slave and real-time instructions to help improve work efficiency.

The TH1779 DC bias current source is suitable for AC/DC superposition testing of magnetic inductors and test occasions requiring high currents, and can also be used as a magnetization current source for analysis of magnetic materials.

The TH1779 DC Bias Current Source provides both physical keypad and footswitch controls to ensure operator safety, and can be used for manual control when connecting to other unspecified models of LCR digital bridges or other brands of LCR bridges with Whitney.

The TH1779 DC bias current source is equipped with a test interface that can be directly connected to our specified LCR bridges and can be directly controlled by the corresponding LCR digital bridge.

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Summary parameters TH1779
client-server (computing) One master, the rest are slaves, support up to 8 parallel machines
Output Current Stand-alone: 0-50A

Parallel: 400A

frequency response 0Hz-2MHz
open circuit voltage 16V

Test Signal Level Correlation for Magnetic Inductors

Signal level correlation exists for all components: component values are related to the magnitude of the signal level at a specified test frequency.

Some components are extremely sensitive to signal levels, such as ceramic capacitors with high K (high dielectric constant) values and inductors with high permeability.

Therefore, it is important to specify the measured signal level (voltage or current) for such devices. The correlation between the component and the signal level is shown in the following figure

image.png

 

Test Signal Level Correlation for Magnetic Inductors

Components are correlated with the DC bias voltage or bias current applied to them. The superposition of AC and DC signals is extremely common in the various uses of components. For example, the junction capacitance of diodes and transistors, high-K ceramic capacitors, electrolytic capacitors, inductors with ceramic cores or transformers. The DC voltage or current superimposed on the different parameters will cause changes, some device parameters may produce drastic changes.

image.png

As seen in the above figure, the magnetic inductance decreases as the superimposed DC bias current increases.

Since the external DC bias current is usually large, the amplitude of the DC voltage level signal at both ends of the inductor will be much larger than the amplitude of the AC level signal output by the LCR. Therefore, after superimposing the DC bias current, the AC level signal set by the LCR has basically no effect on the inductance.

In order to ensure the stability of the inductance test, it is usually sufficient to set the LCR AC level to 1V.

Technical Parameters

model number TH1779
client-server (computing) Host or Slave
demonstrate monitor (computer) 7-inch 800 x 480 RGB TFT LCD
interfaces fully graphical
manipulate Physical buttons + footswitch
range (of scales or measuring equipment) 50A
current step realm 0mA-50A
resolution (of a photo) 100mA
Supported Measurement Frequency 1kHz-2MHz
Current rise time 1A/s - 20A/s, can be set arbitrarily
Current drop time 1A/s - 20A/s, can be set arbitrarily
Scan Adjustment Minimum Step 100mA
Maximum Output Voltage 16V
Maximum Allowable DC Resistance Rmax=Vmax / I (Ω) (R)max(Please refer to the user's manual for calculations)
Maximum Allowable Inductance Lmax=Vmax /(di/dt) (mH) (refer to user manual for Lmax calculation)
Start and stop control mode START/STOP physical buttons, buses, controlled by host computer
Continuous loading of maximum current time 2-3h, uninterrupted output
functionality Instrument fault self-test; Chinese and English bilingual; slave soft switch; real-time operation; SCPI instruction set, etc.
connector RS232, SlaverLink
temp proper functioning 0°C-55°C
benchmarking 23(±5)°C
Transportation environment 0°C-55°C
humidity level proper functioning <90%RH
benchmarking <80%RH
Transportation environment <93%RH
power supply input voltage AC 220V/110V (±10%)
frequency 50Hz/60Hz (±5%)
power wastage Standby: ≤100VA, full load: 1.5kVA
Volume (mm) Single 430W x 177H x 585D (not in cabinet volume)
weights Single unit 26.5kg (not in cabinet weight)

- Single 0-50A constant current output, can be used as master or slave

- Support up to 8 sets of on-line, maximum 400A constant current output

- Master/slave control mode, flexible tailorability and scalability

- Fine current stepping

- 0Hz-2MHz frequency response

- Two types of current outputs: single current and step scanning

- Graphical operation, Chinese and English interface

- Directly controlled by TH2851/TH2848/TH2840/TH2836/TH2839/TH2838 series

■ Inductor/Reactor DC Characterization

■ Iron core/ferrite material saturation characterization

■ DC characterization of other materials

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