TH2638 series high-speed precision capacitance measuring instrument is a new type of capacitance measuring instrument with up to 1MHz testing frequency, small size, compact and portable, easy to use on the shelf. 4.3-inch LCD screen can be selected from the English operation interface, easy and fast operation.
TH2638 series measuring capacitance basic accuracy of ± 0.07%, loss accuracy of up to 0.0005, the highest speed of up to 2.3ms; ultra-wide range configuration, so that the TH2638 series can accurately measure all kinds of capacitance from the low value to the high value; ultra-wide range of output impedance and the signal level compensation function, especially suitable for the use of a stable test level of ceramic capacitors with high-speed high precision testing; three-parameter (Cs-Rs-Ls) test function to solve the new energy automotive DC-Link film capacitor series equivalent inductance ESL testing challenges. The three-parameter (Cs-Rs-Ls) test function solves the problem of testing the series equivalent inductance ESL of DC-Link film capacitors for new energy vehicles.
TH2638 series is compatible with SCPI command set; with robot interface and bin classification function, suitable for automatic classification of high-speed test products in production line; scanner interface with up to 256 scanning channels greatly improves the production efficiency; the checking function of bad contact greatly reduces the rate of misjudgment in rapid test of the production line; when the test frequency is 1MHz, the frequency offset setting function (1MHz ± 1%, 1MHz±2%) when the test frequency is 1MHz, the frequency offset setting function (1MHz±1%, 1MHz±2%) eliminates the interference of neighboring measurement terminals in the array capacitor test system and reduces the fluctuation of measurement results.
Customized test fixtures are available for DC-Link film capacitors of different sizes.
TH2638 series high speed precision capacitance tester includes the following types:
| Summary parameters | TH2638 | TH2638A | TH2638B | TH2638C |
| Test Frequency | 100Hz, 120Hz, 1kHz, 10kHz, 100kHz, 1MHz, 1MHz±1%, 1MHz±2% | 100Hz, 120Hz, 1kHz, 10kHz, 40kHz, 100kHz | 100Hz, 120Hz, 1kHz, 10kHz | 100Hz, 120Hz, 1kHz |
| Basic precision | C:0.07%, D:0.0005 | |||
| test level | 0.1Vrms-1Vrms | |||
| Output Impedance | 1.5Ω, 0.5Ω, 0.3Ω, 10Ω | |||
Functional Features
High speed, high accuracy, high consistency
Test speed: 2.3ms (100kHz/1MHz), 3.0ms (1kHz/10kHz/40kHz), 11.0ms (120/100Hz)
Capacitance testing accuracy: ±0.07%, loss factor: ±0.0005
18 range configurations, 3 times the range of traditional LCRs, ensure high accuracy and consistency even at high speeds.
| TH2638 | l | l | l | l | l | |
| TH2638A | l | l | l | l | l | |
| TH2638B | l | l | l | |||
| TH2638C | l | l | ||||
| frequency range | 100Hz, 120Hz | 1kHz | 10kHz | 40kHz | 100kHz | 1MHz |
| 1pF | l | |||||
| 2.2pF | l | |||||
| 4.7pF | l | |||||
| 10pF | l | l | ||||
| 22pF | l | l | l | |||
| 47pF | l | l | l | |||
| 100pF | l | l | l | l | l | |
| 220pF | l | l | l | l | l | |
| 470pF | l | l | l | l | l | |
| 1nF | l | l | l | l | l | |
| 2.2nF | l | l | l | l | ||
| 4.7nF | l | l | l | l | ||
| 10nF | l | l | l | l | l | |
| 22nF | l | l | l | l | l | |
| 47nF | l | l | l | l | l | |
| 100nF | l | l | l | l | l | |
| 220nF | l | l | l | l | l | |
| 470nF | l | l | l | l | l | |
| 1μF | l | l | l | l | l | |
| 2.2μF | l | l | l | l | ||
| 4.7μF | l | l | l | |||
| 10μF | l | l | l | |||
| 22μF | l | l | ||||
| 47μF | l | l | ||||
| 100μF | l | l | ||||
| 220μF | l | |||||
| 470μF | l | |||||
| 1mF | l |
The setting of test speed and range solves the following problems
1. High-speed testing accuracy and can not be guaranteed
2. Measurement instruments do not meet the test requirements of high-throughput automated equipment
3. Poor consistency of data across multiple tests when test speed is met
Extremely wide measuring range from low to high capacitance values
| Test Frequency | Measurement range |
| 1MHz | 0.001fF-1.5nF |
| 100kHz | >6.8pF |
| 40kHz | >15pF |
| 10kHz | >68pF |
| 1kHz | >68pF |
| 100Hz/120Hz | >6.8nF |

Accurate Testing of DC-Link Film Capacitors for New Energy Vehicles
The three-parameter (Cs-Rs-Ls) test function solves the test problems of series equivalent resistance (ESR) and series equivalent inductance (ESL) of DC-Link film capacitors for new energy vehicles. With the rapid development of industry, energy shortage has become a worldwide problem, and new energy vehicles have become the main direction of the future development of the automotive industry. Motor, battery and motor control technology are the three core of new energy vehicles. The core of motor control technology is the need for high efficiency motor control inverter technology, high efficiency motor control inverter technology requires a powerful IGBT module and a matching DC-Link capacitor. As shown in the figure below:

Features of DC-Link film capacitors.
- High capacity, up to 1000μF or even higher
- Stable frequency characteristics, good high-frequency characteristics of the product, the working frequency is about 10kHz.
- Low ESR (Series Equivalent Resistance), the minimum can be up to 0.2-0.5mΩ, or even smaller, through the ability to withstand ripple current is strong
- Low ESL (series equivalent inductance), down to <10nH, reduces the oscillating effect at switching frequency, so that the absorption capacitance can be neglected.
- Good safety, strong overvoltage resistance, surge voltage resistance greater than 1.5 times the rated voltage.
- No polarity, can withstand reverse voltage
- Rated voltage up to 800V or more, no need for series and balancing resistors
How to test DC-Link correctly and quickly is a worldwide challengeTH2638A is based on more than 20 years of technology accumulation in capacitance testing industry, Tonghui creatively invented a technology to measure Cs, ESR and ESL at the same time under one frequency, which makes the DC-Link capacitor can be stable tested up to 1mF capacity, 1μΩ stable value of ESR, 0.01nH stable value of ESL under the set frequency, and perfectly solves the problem. This is a perfect solution to this problem, which provides an efficient, cost-effective and perfect solution for the majority of DC-Link capacitor manufacturers.

Low impedance test, signal level compensation function

Low Output Impedance: Low output impedance as low as 0.3Ω enables high-speed, accurate testing of large capacitors and even supercapacitors.
| Output Impedance | 100Hz/120Hz | SLC OFF (≥220μF range) | 1.5Ω |
| SLC ON (≥220μF range) | 0.3Ω | ||
| 10nF-100μF range | 10Ω | ||
| 1kHz | SLC OFF (≥22μF range) | 1.5Ω | |
| SLC ON (≥220μF range) | 0.3Ω | ||
| 220nF-10μF range | 0.3Ω | ||
| 100pF-100nF range | 10Ω | ||
| 10kHz | ≥2.2μF range | 1.5Ω | |
| 100pF-1μF range | 10Ω | ||
| 40kHz | All ranges | 10Ω | |
| 100kHz | All ranges | 10Ω | |
| 1MHz | All ranges | 10Ω |

Contact check function and synchronized signal source function
-
- Contact check without extra time, only outputs signals during the test. Ensures that the test data is correct and valid and avoids bad contacts caused by prolonged contact.

Synchronized signal output ensures that multiple instruments of the same type on the test line are synchronized with the same time base.
- Contact check without extra time, only outputs signals during the test. Ensures that the test data is correct and valid and avoids bad contacts caused by prolonged contact.

Frequency offset setting
The 1MHz test frequency can be biased to: 1MHz -2%, -1%, +1% and +2%.
When two or more capacitance meters are integrated into an automated robotic system (e.g., an array capacitor test system) or the same workbench, the frequency offset setting function can be used to set multiple instruments to different frequencies, effectively eliminating interference between neighboring measurement terminals and reducing fluctuations in measurement results.
Scanner Interface and Bin Classification
Bin classification: 9 bins are set up according to the quality of the product to determine the product based on the C-D/Q/R/G test results.

Compatible with SCPI instruction set, rich interface
accessory

| model number | TH2638 | TH2638A | TH2638B | TH2638C | ||||
| Test Signal Parameters | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs, Cs-Rs-Ls | Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs | |||||
| test signal | ||||||||
| frequency | Permissible frequency | 100Hz, 120Hz, 1kHz, 10kHz, 100kHz, 1MHz,
1MHz±1%, 1MHz±2% |
100Hz, 120Hz, 1kHz, 10kHz, 40kHz, 100kHz | 100Hz, 120Hz, 1kHz, 10kHz | 100Hz, 120Hz, 1kHz | |||
| accurate | ±0.02% | |||||||
| power level (elec.) | realm | 0.1V-1V | ||||||
| resolution (of a photo) | 0.01V | |||||||
| accurate | ±5% | |||||||
| output method | Continuous or synchronized | |||||||
| signal source delay | realm | 0-1s | ||||||
| resolution (of a photo) | 0.1ms | |||||||
| Output Impedance | 100Hz
120Hz |
SLC OFF | range (of scales or measuring equipment) | ≥220μF | 1.5Ω | |||
| SLC ON | range (of scales or measuring equipment) | ≥220μF | 0.3Ω | |||||
| range (of scales or measuring equipment) | 10nF-100μF | 10Ω | ||||||
| 1kHz | SLC OFF | range (of scales or measuring equipment) | ≥22μF | 1.5Ω | ||||
| range (of scales or measuring equipment) | ≥22μF | 0.3Ω | ||||||
| SLC ON | range (of scales or measuring equipment) | 220nF-10μF | 0.3Ω | |||||
| range (of scales or measuring equipment) | 100pF-100nF | 10Ω | ||||||
| 10kHz | range (of scales or measuring equipment) | ≥2.2μF | 1.5Ω | ------ | ||||
| range (of scales or measuring equipment) | 100pF-1μF | 10Ω | ------ | |||||
| 40kHz | ------ | 10Ω | ------ | ------ | ||||
| 100kHz | 10Ω | ------ | ------ | |||||
| 1MHz | 10Ω | ------ | ------ | ------ | ||||
| test speed | Five test speed options: 1, 2, 4, 6, 8 | |||||||
| Maximum measurement speed | 100Hz/
120Hz |
11ms | ||||||
| 1kHz
10kHz |
3.3ms | |||||||
| 40kHz | ------ | 3ms | ------ | ------ | ||||
| 100kHz | 2.5ms | ------ | ------ | |||||
| 1MHz | 2.3ms | ------ | ------ | ------ | ||||
| Test range method | Automatic, Hold | |||||||
| Average number of times | 1-256 | |||||||
| trigger method | Internal, manual, external, bus | Internal, manual, external (except SCANER), bus (except GPIB) | ||||||
| Trigger delay time | realm | 0-1s | ||||||
| resolution (of a photo) | 0.1ms | |||||||
| Measurement display range | ||||||||
| parameters | Cs, Cp | ±1.000000aF - 999.9999EF | ||||||
| D | ±0.000001 - 9.999999 | |||||||
| Q | ±0.01 - 99999.99 | |||||||
| Rs, Rp | ±1.000000aΩ - 999.9999EΩ | |||||||
| G | ±1.000000aS - 999.9999ES | |||||||
| Δ% | ±0.0001% - 999.9999% | |||||||
| Basic Measurement Accuracy | C:0.07%, D:0.0005 | |||||||
| Display mode | Floating/fixed decimal point display, ΔABS, Δ% | |||||||
| List Scanning | 10-point list scanning for frequency and voltage | |||||||
| Comparator Functions | 11 gears: BIN1-BIN9, OUT_OF_BIN, AUX_BIN | |||||||
| connector | RS232C, LAN, USB HOST, USB DEVICE, HANDLER, GPIB, SCANNER | RS232C, LAN, USB HOST, USB DEVICE, HANDLER | ||||||
| internal storage | 40 instrument setup files | |||||||
| External USB storage | -GIF images -40 instrument setting files -Test data stored directly in USB memory -Screenshot files saved directly to USB memory | |||||||
| General technical indicators | ||||||||
| Temperature, humidity, altitude
(operating environment) |
0°C - 45°C, 15% - 85% RH (≤40°C, non-condensing), 0 - 2000m | |||||||
| Power supply | input voltage | 90VAC - 264VAC | ||||||
| frequency | 47Hz - 63Hz | |||||||
| power wastage | Maximum 150VA | |||||||
| Temperature, humidity, altitude (storage environment) | -20°C - 70°C, 0 - 90% RH (≤65°C, non-condensing), 0 - 4572m | |||||||
Note: 1. 1MHz contains 1MHz ± 1%, 1MHz ± 2% 2. a: 1e-18, E: 1e18
■ 测试频率:100Hz、120Hz、1kHz、10kHz、100kHz、1MHz
■ 1MHz时的测试频率带有偏移功能(±1%,±2%)
■ Test capacitance basic accuracy ±0.07%, loss factor: ±0.0005
■ Maximum test speed: 2.3ms/time, with five speeds to choose from
■ 4.3-inch TFT liquid crystal display, Chinese and English optional operation interface
■ Low impedance test, signal level compensation function
■ Measurement data can be saved directly to a USB flash drive
■ Screenshots saved to a USB flash drive
■ Contact check function
■ Synchronized signal sources
- High-speed, high-precision testing of electrolytic capacitors
- High-speed, high-precision testing of DC-Link capacitors
- High-speed and high-precision testing of ceramic capacitors
- High-speed, high-precision testing of film capacitors
- High-speed testing of various capacitor production lines
- High-speed automated production line integration testing
- Semiconductor, device, material distributed capacitance testing
- Various other capacitors ......
| standard equipment | |||||
| Accessory Name | model number | ||||
| Four ends with card fixture | TH26005C | ||||
| short circuit board | TH26010 | ||||
| Test Fixture | TH26078 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011BS | ||||
| optional | |||||
| Accessory Name | model number | ||||
| Magnetic Ring Clamp (Piece Type) | TH26007A | ||||
| Magnetic Ring Fixture | TH26008A | ||||
| Patch Test Leads with Boxes | TH26009B | ||||
| fixture (machining) | TH26047 | ||||
| Test Fixture | TH26062 | ||||
| Test Fixture | TH26063 | ||||
| High Frequency Patch Fixture | TH26108C | ||||
| Dielectric Test Fixture | TH26077 | ||||
Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.


















