Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
TH2827 series is a new type of LCR digital bridge with multiple functions and higher testing frequency, small size, compact and portable, easy to use on the shelf. The basic accuracy of this series of instruments is 0.05%, the highest test frequency of 1MHz and 10mHz resolution, 4.3-inch LCD screen with Chinese and English operation interface, convenient and simple operation. The integrated transformer test function improves the test efficiency. The instrument provides a wealth of interfaces to meet the automatic sorting test, data transmission and storage of various requirements.
Functional Features:
A. Functions and Interfaces
In addition to the conventional LCR test parameters, the instrument also integrates a single transformer test function, which can test the primary/secondary inductance, primary/secondary DC resistance, mutual inductance, initial and capacitance and other common transformer parameters, which greatly improves the test efficiency.
B. Material dielectric constant test
The TH2827 series, together with the specialized material test fixture TH26077 and the host computer software, can easily and accurately measure the dielectric constant of materials at different frequencies.
Basic accuracy factor curve:
Note: Test signal level: 0.3Vrms - 1Vrms
The upper values (those without parentheses) apply to medium and slow speeds, the
The lower values (in parentheses) apply to the fast.
| model number | TH2827A | TH2827C | ||
| monitor (computer) | 4.3 TFT LCD display 480 x 272 | |||
| test signal | frequency | 20Hz - 300kHz  20Hz - 1MHz |
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| minimum resolution | 10mHz, 4-bit frequency input | |||
| accuracy | 0.01% | |||
| AC level | Test Signal Voltage Range | 5mV - 2Vrms | ||
| Voltage Minimum Resolution | 100μV, 3-bit input | |||
| Accuracy Test Signal | ALC ON | 10% x set voltage + 2mV | ||
| ALC OFF | 6% x set voltage + 2mV | |||
| current range | 100μA - 20mA | |||
| Current Minimum Resolution | 1μA, 3-bit input | |||
| accuracy | ALC ON | 10% x set current + 20μA | ||
| ALC OFF | 6% x set voltage + 20μA | |||
| DC Bias Voltage Source | Voltage / Current Range | 0V - ±5V / 0mA - ±50mA | ||
| resolution (of a photo) | 0.5mV / 5μA | |||
| Voltage Accuracy | 1% x set voltage + 5mV | |||
| ISO ON | For inductor, transformer plus bias test | |||
| AC source internal resistance | ISO ON | 100Ω | ||
| ISO OFF | 30Ω, 50Ω, 100Ω selectable | |||
| DCR Source Internal Resistance | 30Ω, 50Ω, 100Ω selectable | |||
| LCR Test Parameters | |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR, VDCIDC | |||
| Test page parameter display | One set of primary and secondary parameters; 10-point list scanning | |||
| Transformer test parameters | L1 Primary Inductance, L2 Secondary Inductance, DCR1 (Primary, Terminal 2), DCR2 (Secondary, Terminal 2), M (Mutual Inductance), N, 1/N | |||
| Basic Measurement Accuracy | LCR Test Parameters | 0.05% | ||
| calibration condition | Warm-up time: ≥ 30 minutes; Ambient temperature: 23±5°C; Signal voltage: 0.3Vrms - 1Vrms; Clear "0":
After OPEN, SHORT; Test cable length: 0 m |
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| Measurement time (≥10 kHz) | Fast: 9 ms Medium: 67 ms Slow: 187 ms, plus display character refresh time | |||
| LCR parameter display range | | z | , r , x , dcr | 0.00001Ω - 99.9999MΩ | ||
| |Y|, G, B | 0.00001μs - 99.9999s | |||
| C | 0.00001pF - 9.99999F | |||
| L | 0.00001μH - 99.9999kH | |||
| D | 0.00001 - 9.99999 | |||
| Q | 0.00001 - 99999.9 | |||
| θ (DEG) | -179.999o - 179.999o | |||
| θ (RAD) | -3.14159 - 3.14159 | |||
| Δ% | -999.999% - 999.999% | |||
| equivalent circuit | Series, Parallel | |||
| Measurement range | Automatic, Hold | |||
| trigger method | Internal, Manual, External, Bus | |||
| Average number of times | 1 - 256 | |||
| calibration function | Open Circuit, Short Circuit Full Frequency, Spot Frequency Calibration, Load Calibration | |||
| mathematical operation | Direct reading, ΔABS, Δ% | |||
| Delay time setting | 0 - 999, minimum resolution 100us | |||
| Comparator Functions | 10-position binning, BIN1 - BIN9, NG, AUX | |||
| stall counting function | ||||
| PASS, FAIL front panel LED display | ||||
| List Scanning | -201 point list scanning
-Separate list scan tests for frequency, AC voltage/current, and internal/external DC bias voltage/current. -The first 10 scanning points can be sorted individually |
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| internal non-volatile memory | 40 sets of LCRZ instrument setting file memory | |||
| External USB memory | GIF images, CSV data files, LCRZ instrument setting files, memory test data USB, direct memory storage | |||
| connector | I/O Interface | HANDLER, output from the rear panel of the instrument | ||
| serial communications interface | USB, RS232C | |||
| Parallel Communication Interface | GPIB interface (option) | |||
| network interface | LAN | |||
| memory interface | USB HOST (front panel) | |||
■ 测试频率:20Hz-300kHz，分辨率：10mHz
■ 基本精度:0.05%
■ 测试速度:最快13ms/次
■ Transformer parameter test function
■ 30Ω, 50Ω, 100Ω selectable internal resistance
■ 201-point list scanning test function
■ Automatic leveling (ALC) function for voltage or current
■ V, I test signal level monitoring function
■ Internal self-contained DC bias source
■ External high current DC bias source available
■ Built-in comparator, 10-step sorting and counting function
▪ Internal file storage and external USB flash drive file saving
■ Measurement data can be saved directly to a USB flash drive
■ 4.3-inch TFT LCD display
■ Selectable operation interface in Chinese and English
■ RS232C, USB HOST, USB DEVICE, LAN, HANDLER, GPIB, DCI Interface
■ Passive Components.
Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, and network components, etc.
■ semiconductor element:
Test and analysis of parasitic parameters of LED driver integrated circuits; C-VDC characteristics of varactor diodes; analysis of parasitic parameters of transistors or integrated circuits
■ Other components.
Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
■ Media Material.
Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials
■ Magnetic material.
Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials
■ Semiconductor materials.
Dielectric constant, conductivity and C-V properties of semiconductor materialsLiquid crystal materials: C-V properties of liquid crystal units such as dielectric constant and elasticity constant
■ Liquid Crystal Unit.
C-V properties such as dielectric constant, elasticity constant, etc.
| standard equipment | |||||
| Accessory Name | model number | ||||
| Transformer Test Fixture | TH26038 | ||||
| fixture (machining) | TH26048 | ||||
| short circuit board | TH26010 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011AS | ||||
