ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope
ZDS3000/2000C General Purpose R&D Oscilloscope

ZDS3000/2000C General Purpose R&D Oscilloscope

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ZDS3000/2000C General Purpose R&D Oscilloscope

General-purpose R&D oscilloscopes help electronics engineers quickly complete product testing through the data analysis process of "anomaly triggering - large data capture - parameter measurement - waveform search - find the problem".

250M storage depth

If the storage depth can be large enough to maintain a high waveform sampling rate, the observed waveform will be more realistic and detailed. On the contrary, if the storage depth is only 1Mpts or even lower, the oscilloscope can only be forced to reduce the sampling rate when observing waveforms of larger duration. Due to the lack of sampling points, the waveform displayed by the oscilloscope will be seriously distorted, and even produce waveform aliasing, misleading users to measure and analyze. zDS3000/2000B series oscilloscopes innovatively adopt DDR3 storage technology, with large-scale FPGA devices, through full hardware acceleration and multi-threaded parallel processing, the storage depth can reach up to 250M! No loss of waveform details even when observing long time waveforms.

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protocol decoding

When debugging protocol signals, it is not only necessary to observe the protocol waveform, but also to decode the waveform into corresponding data. ZDS3000/2000B series oscilloscopes are equipped with 41/29 protocols for free based on customer needs, including CAN, LIN, IIC, SPI, UART, USB, PS/2, DALI, Wiegand, 1-Wire, DS18B20, HDQ, SD_SPI, SD_SD, IrDA, DS18B20, HDQ, SD_SPI, SD_SD, IrDA, DS18B20, SD_SPI, SD_SD, IrDA, DS18B20, HDQ, SD_SPI, SD_SD, IrDA, Manchester, DiffManche, Miller, DHT11, SHT11, NEC, RC5, RC6, FlexRay, etc. In addition to this, the ZDS3000/2000B series of oscilloscopes are also equipped with CAN FD protocol decoding for free. The ZDS3000/2000B series oscilloscopes have once again defined the 200M oscilloscope!

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Waveform refresh rate of 330,000 times/second

Due to the technical limitations of the real-time processing capability of the waveform synthesizer and the throughput bandwidth of the waveform memory, the waveform refresh rate of the 2000 series oscilloscopes is generally very low, and there exists a lot of dead time in the waveform observation, and the user will miss many waveform details, which greatly reduces the work efficiency.The R&D team of the ZDS3000/2000B series oscilloscopes adopts a large-scale FPGA to break through various technical difficulties. ZDS3000/2000B series oscilloscope R&D team uses large-scale FPGAs to break through the technical difficulties, and tries different ways to realize each line of code to seek for better results. From the beginning of 75K to 150K, 260K to the final 330K, constantly breakthrough and strive for excellence. Higher waveform refresh rate allows users to quickly find abnormal signals, significantly improving work efficiency.

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Template Trigger

Engineers often encounter signals that are difficult to capture when debugging products. Without knowing the characteristics of the signal, can we capture it in an easy-to-use way? The R&D team added the template trigger function on top of the powerful trigger function of the oscilloscope. Through the principle of touch filtering, it realizes the function that can isolate any regular abnormal signals. It makes testing easy and interesting.

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4Mpts FFT analysis

Most of the 2000 series oscilloscopes on the market only support a maximum of 8K sample points of FFT analysis, in the case of 1G sampling rate, the frequency resolution is only 125KHz, most of the cases can not accurately determine the distribution of the signal spectrum.ZDS3000/2000B series oscilloscopes refused to purely function stacking, the internal use of a professional processing chip, breakthroughs in the technical barriers to the number of FFT analysis points. ZDS3000/2000B series oscilloscopes are upgraded to 4M sample points, the same in the case of 1G sampling rate frequency resolution can be accurate to 250Hz, you can accurately analyze the source of interference noise in the circuit, and greatly improve the practical value of the oscilloscope FFT. 4Mpts FFT analysis function, not only in the quantitative breakthroughs, but also in the quality of the leap.

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Supports automatic measurement of more than 50 parameters

It is far from enough to analyze the waveform only through the visual performance of the waveform, and only through the precise quantification of the waveform indicators can we see through the nature of the waveform abnormality. However, due to architectural and chip constraints, the majority of oscilloscope parameter measurements are based on sampling results, no matter how many signal cycles there are in the screen, only one cycle of the signal is extracted from each screen for statistical measurements, which directly leads to serious distortion of the results. In order to realize meaningful parameter measurement statistics, we use FPGA for full hardware acceleration, and calculate the maximum value, minimum value, average value and standard deviation of each index through the measurement of each cycle signal on the screen, realizing the meaningful parameter measurement function, and up to more than 50 kinds.

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Waveform search function

When debugging a signal waveform, we need to clarify whether the signal appears abnormal. If there are abnormalities, how often do these abnormal signals appear, and do they appear periodically? In order to figure out these questions, it is generally necessary to record waveforms for a long time, and then locate the position of abnormal waveforms based on such a huge waveform database. relying on the advantages of mass storage and hardware acceleration, ZDS3000/2000B series oscilloscopes can quickly locate the signals of interest from hundreds of thousands of waveforms, and as long as the waveforms and signals that meet the search conditions are on the screen, the system will automatically mark the corresponding position, and the system will automatically mark the corresponding position, and then the system will automatically mark the corresponding position. As long as there is a waveform that meets the search criteria, the system will automatically mark the corresponding position, so that abnormal signals can be seen at a glance.

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Loop Test

ZDS3000 series oscilloscopes support loop test analysis software. Compared with hundreds of thousands of professional loop analyzers, the embedded loop test and analysis software not only has perfect loop test methods and precise measurement accuracy, but also has innovative design for test operation and user experience.

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Power Analysis

The quality of switching power supply directly affects the technical performance of the product as well as its safety and reliability. The problems of many power supply test items, large amount of calculation, and cumbersome statistics have been troubling the engineers. To solve these problems, Zhiyuan Electronics has added power supply analysis functions such as switching loss, SOA, and inductance test to its oscilloscopes. For example, inductance test function can directly calculate inductance, active power and other items, which is convenient for engineers to quickly and accurately test power supply products.

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Switching Loss Measurement at the touch of a button

PFC MOS tube switching loss test is a difficult point in power supply debugging, due to different cycles of voltage and current waveforms are not the same, the accurate assessment of power loss is also more dependent on a long time and high sampling rate of the waveform capture, so the depth of storage and the original number of points of the power loss operation has become the key to the accuracy of the switching loss. zds3024 oscilloscope is equipped with a standard storage depth of 250M, and through the full hardware acceleration processing optimization can accurately quantify the switching device power loss. Optimized to accurately quantify the power loss of switching devices.

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SOA Secure Workspace Testing

Switching devices are subjected to high power consumption over a long period of time, and over-voltage or over-current can lead to device damage or even explosion. Although the IDM and VDS parameters are clearly labeled in the device manual, conventional debugging methods are unable to evaluate the entire operating cycle of the device. The customized SOA measurement function of ZDS3024 can accurately evaluate all the states of the switching devices during the whole working cycle, and clearly give the abnormal probability of the power supply exceeding the safe working area, which facilitates engineers to better evaluate the working stability of the power supply.

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ZDS3000/2000C General Purpose R&D OscilloscopeZDS3000/2000C General Purpose R&D Oscilloscope

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