TH2826 High Frequency LCR Digital Bridge

■ 测试频率：20Hz～5MHz，分辨率：10mHz步进

■ Basic accuracy: 0.1%

■ 测试速度：200次/s

■ 压电陶瓷、超声波换能器等器件的阻抗分析

■ Multi-parameter and multi-frequency list scanning function.

■ 测试电平10mV～5V, 1mV步进

■ 320 x 240 dot matrix large graphic LCD display

■ Five-digit readout resolution

■ 22 combinations of impedance parameters can be measured

■ Output impedance of four signal sources

■ 10-point list scan test function

■ Internal self-contained DC bias source

■ External bias source to 40A (option)

■ Automatic leveling (ALC) function for voltage or current

■ V, I test signal level monitoring function

■ Graphic scanning analysis function

■ 20 sets of internal instrument settings for storage/reading

■ Built-in comparator, 10-speed sorting and counting function

■ Multiple communication interfaces for user-friendly on-line use

■ 2m/4m test cable extension (option)

■ Selectable operation interface in Chinese and English

Automatic upgrading of the instrument's operating program via USB HOST is possible.

■ passive component

Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, and network components, etc.

■ semiconductor element

Test and analysis of parasitic parameters of LED driver integrated circuits; C-VDC characteristics of varactor diodes; analysis of parasitic parameters of transistors or integrated circuits

■ other components

Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.

■ medium material

Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials

■ magnetic material

Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials

■ semiconductor material

Dielectric constant, electrical conductivity and C-V properties of semiconductor materials

■ liquid crystal unit

C-V properties such as dielectric constant, elasticity constant, etc.