Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
S series high-precision digital source meter is the first localized source meter with high precision, large dynamic range and digital touch, which is built by Purcells for many years, integrating various functions such as input/output and measurement of voltage and current.
With a maximum output voltage of 300V, a minimum current resolution of 10pA, and support for four-quadrant operation, it is widely used in a variety of electrical characterization tests: semiconductor ICs or components, power devices, sensors, and organic and nano-materials, etc. Characterization tests and analysis.
| model number | Maximum voltage source/range | Maximum current source/range | maximum power | accurate | communications interface |
|---|---|---|---|---|---|
| S100 | 30V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
| S200 | 100V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
| S300 | 300V | 1A | 30W | 0.1% | RS-232/GPIB/LAN |
*The above specifications are subject to update without prior notice.
● 5-inch touchscreen display with full graphical operation
:: Up to 300V and down to 10pA, with a maximum test power of 30w
● Supports front and rear panels, 2/4 wires, and GUARD protection.
● Multiple communication methods: RS-232, GPIB, Ethernet.
● Full scale output and measurement accuracy up to 0.1%
● Standard SCPI instruction set, which is easy for customers' secondary development.
:: Easy-to-build semiconductor electrical test program
:: Can be used to test the electrical properties of semiconductors: I, V, R
Why S-Series Digital SourceMeter?
- powerful-Acts as a voltage source and or current source, and measures current and or voltage simultaneously, supporting four-quadrant operation. Can limit the size of voltage or current output to prevent device damage.
- all sorts of flexibility-Support two-wire and four-wire measurement, more accurate measurement of low internal resistance; integrated linear step scan, logarithmic step scan, custom scan mode; professional l-V characteristics and semiconductor parameter test software.
- easy learn and practical-Simplifies measurement preparation for a variety of applications such as I-V and l-t/V-t curves. Capacitive touch-screen graphical user interface (GUI), providing two modes of displaying measurement results, graphical and digital, for ease of use and viewing.
All-in-one high-precision SMU for ultimate simplicity of measurement
Traditional semiconductor I-V characterization solutions are often complex and costly, requiring multiple instruments to be used in conjunction with each other to complete the test. Programming, synchronizing, connecting, measuring, and analyzing the different instruments is complex, time-consuming, and takes up a lot of test bench space.
The S-Series digital source meters can be used as stand-alone constant voltage or constant current sources, voltmeters, ammeters, and ohmmeters, as precision electronic loads, and their high-performance architecture allows them to be used as waveform generators, as well as automated current-voltage (I-V) characterization systems. This dramatically reduces the time required to develop, build, and maintain a test system, while saving valuable "space" in the test rack or test bench and reducing the overall cost of purchasing a test system.
Four-quadrant operation, either as source or load
The power supply quadrant is the quadrant map formed with the power supply output voltage as the X-axis and output current as the Y-axis. The first and third quadrants, i.e., the voltage and current are in the same direction, and the source meter supplies power to other devices, which is called the source mode; the second and fourth quadrants, i.e., the voltage and current are reversed, and other devices discharge power to the source meter, and the source meter passively absorbs the incoming current and can provide a return path for the current, which is called the trap mode.
Unlike traditional matrix power supplies, S series source meters can be selected by customers to have either high voltage and low current or low voltage and high current outputs under the same power level according to their actual needs. Different ranges are selected, and the source/trap limits of S series source meters are also different.
Source Limits - Voltage Sources.
10V (≤3A range), 30V (≤1A range), 300V (≤100mA range)
Source Limits - Current Sources.
Earth 3.15A (≤10V range), Earth 1.05A (≤30V range), Std 105mA (≤300V range)
Easily meets common measurement needs
Touch any icon on the screen to bring up the graphical setup screen. Follow the wizard to set up one by one before measurement for more intuitive operation.
Applications offered
- Sequence scanning
- Custom Sequences
- Data Logger: Continuous Output Constant Voltage Source Test Mode; Continuous Output Constant Current Source Test Mode
- APD tube
- Transistors: MOSFET tube test; Triode test
- LIV: PIN Tube Scan Test
- Gummer: dual source tables scanned with the same parameters
*Diode complete l-V characteristic curve
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