Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
High-speed detection of up to 100 points/sec and improved detection accuracy
Insulation test range up to 100 GΩ at 10 V
:: Ideal for inspection of probe card substrates
FA1815-20 Product Introduction Video
Flying probe tester FA1815-20 for testing high-precision substrates used in cutting-edge IT technology The FA1815-20 offers speeds of up to 100 points per second at the fastest speeds, high probe positioning accuracy, and insulation resistance of up to 100 GΩ at 10 V. The FA1815-20 is designed for testing high-precision substrates used in cutting-edge IT technology. It contributes to increased productivity in the semiconductor industry by shortening inspection time for high-precision substrates represented by probe cards and realizing high quality by eliminating potential defects.
■ Outline of specifications
| armchair number | 4 (2 above, 2 below) | |
|---|---|---|
| Probe mountable | 1172 Series, CP1072 Series, CP1073 Series | |
| Test Steps | 4,000,000 steps. | |
| Test Items and Measurement Range | DC Constant Current On Test | 400.0 mΩ ~ 1.000 kΩ |
| DC Constant Current Resistance Test | 40.00 μΩ ~ 400.0 kΩ | |
| DC Constant Voltage Resistance Testing | 4.000 Ω ~ 40.00 MΩ | |
| Insulation resistance test | 1.000 kΩ ~ 100.0 GΩ | |
| Low Voltage Insulation Resistance Test | 1.000 MΩ ~ 100.0 GΩ | |
| AC Constant Voltage Electrostatic Capacitance Test | 100.0 fF ~ 10.00 μF | |
| Leakage Current Test | 1.000 μA ~ 100.0 mA | |
| High Voltage Resistance Testing | 1.000 kΩ ~ 100.0 GΩ | |
| Capacitor insulation test | 1.000 kΩ ~ 250.0 MΩ | |
| open-circuit test | 4.000 Ω ~ 4.000 MΩ | |
| Embedded Component Substrate Testing | Short Circuit Test | 400.0 mΩ ~ 40.00 kΩ |
| LSI Connection Testing | 0.000 V to 12.00 V | |
| AC Constant Voltage Resistance Testing | 10.00 Ω ~ 100.0 kΩ | |
| AC Constant Voltage Capacitance Test | 10.00 pF to 100.0 μF | |
| AC Constant Voltage Inductance Test | 1.000 μH ~ 1.000 mH | |
| Scope of determination | -99.9% ~ +999.9%, or absolute value | |
| Moving Minimum Resolution | XYZ: 0.1 μm | |
| Minimum Pad Spacing | Top: 34 μm (when using CP1075-09) Below: 44 μm (when using CP1075-09) |
|
| Minimum Pad Size | Top: 4 μm (when using CP1075-09) Below: 14 μm (when using CP1075-09) |
|
| test speed | Max. 100 points/s (0.15 mm movement, 4-arm simultaneous detection, capacitance test) | |
| Testable Substrate Size | Plate thickness: 1 to 12 mm, Dimensions: 50W × 50D × 340W × 340D mm | |
| Maximum testable area | 340W × 340D mm | |
| baseboard fixing | Universal substrate mounting fixture or capacitance test vacuum chuck (optional) | |
| Air used | Primary side pressure 0.5MPa to 0.99MPa (dry air) Maximum air consumption 0.3L/min (ANR) | |
| power supply | AC 200 V, 220 V, 230 V, 240 V single-phase (specify when ordering) 50/60 Hz, 5 kVA | |
| volume・weight | 1355W × 1190H × 1265D mm (except protruding part), 1100 kg±50 kg | |
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