Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Provide more optimized testing solutions for battery safety testing and improve battery testing quality through waveform analysis.
:: Accurately check insulation performance and verify battery and motor quality
:: Waveforms and numerical displays help optimize production processes, analyze recovered nonconforming products, and promote the reliability of inspections.
:: Preventing the flow of small defective products due to arc discharge.
:: Preventing retesting due to miscalculations
● Supports a wide range of international standards. Equipped with a BDV (Breakdown Voltage) measurement function.
Basic parameters (accuracy guaranteed for 1 year)
| Key Features | DC Withstand Voltage Test, Insulation Resistance Test, Insulation Breakdown Voltage Test, Waveform Display Function, ARC Discharge Detection Function, Contact Inspection Function (For details, refer to the "Tests and Functions" table.) |
|---|---|
| Functions at a glance | Interlock, Auto Discharge, Offset Elimination, Instantaneous Output, Command Monitor, I/O HANDLER, Key Lock, Self Test, Calibration Deadline Detection, EXT SW (Remote Control) |
| Operating temperature and humidity range | 0°C to 40°C, 80% RH or less (no condensation) |
| Suitability criteria | Safety: IEC 61010 EMC: IEC 61326 |
| Supply Voltage | AC 100 V to 240 V |
| power wastage | Approx. 180 VA ※ Power supply conditions are 220 V supply voltage, 50/60 Hz supply frequency, DC withstand voltage test in test mode, 2.5 kV test voltage, 5 mA load current load resistance 500 kΩ). |
| Maximum power rating | 800 VA |
| connector | Communication: USB, LAN, EXT. I/O
Options: RS-232C (Z3001), GP-IB (Z3000) Storage: USB flash drive |
| Size-Weight | 305 (W) x 142 (H) x 430 (D) mm (excluding protrusions) 10.0 kg ± 0.2 kg |
| attachment (email) | Power Cord, CD-ROM (PDF: Instruction Manual, Communication Instruction Manual), Male Connector for EXT.I/O, Connector Cover for EXT.I/O, Interlock Release Fixture for EXT.I/O, Startup Guide |
Each test-function
| DC withstand voltage test | Output voltage: DC 0.050 kV ~ 3.000 kV (1 V resolution) Output setting accuracy: ± (1.2% of setting + 20 V) Output current/cutoff current: 20 mA max Current accuracy (*1): 3.00 mA <: ± (1.5% rdg.+2 μA) ≤ 3.00 mA: ± 1.5% rdg. Minimum resolution: 0.001 μA Test time: 0.1 s ～ 999 s, Continue (Timer OFF) Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF Short-circuit current 200 mA or more Test mode W→IR, IR→W, program test |
|---|---|
| Insulation resistance test | Output voltage: DC 50 V ~ 1000 V (1 V resolution)
Output setting accuracy: ± (1.2% of setting + 20 V) Resistance value display range: 100.00 kΩ ～ 200.0 GΩ (0.01 kΩ resolution) |
| Insulation Breakdown Voltage Test | Test method: continuous boost test, step-by-step boost test Measurements: Insulation breakdown voltage (kV), strength of insulation breakdown (kV/mm) Setting contents: initial voltage, end voltage, boosting speed, ARC detection, distance between electrodes, current upper limit value Detecting effective voltage: more than 150V |
| Waveform display function | Waveform display content: voltage, current, insulation resistance Sampling speed: 500 kS/s Memory capacity: 512 K words |
| ARC Discharge Detection Function | Detection method: Monitoring of the variation of the test test voltage Setting content: Test voltage variation rate 1% to 50% Detecting effective voltage: more than 150V |
| memory function | -Waveforms-Graphs Save to USB flash drive Save format: BMP, PNG, CSV files -Panel Save Function -Data storage function |
| Judgment function (judgment output) | Ruled PASS, Ruled FAIL (UPPER FAIL, LOWER FAIL) UPPER_FAIL: measured value > upper limit value PASS: upper limit value ≥ measured value ≥ lower limit value LOWER_FAIL: Measured value < lower limit value |
| Notes (*1) | Add ±(1% rdg.×(5-t ) ) when the ambient temperature t is less than 5°C.
Add ±(1% rdg.×(t-35 )) when ambient temperature t exceeds 35℃. |
Insulation resistance measurement accuracy (*2) (accuracy guaranteed test voltage range: 50 V ~ 2000 V)
| Test Range | 100 kΩ ~ 99.99 GΩ | |
|---|---|---|
| 10 nA≦ I≦ 3 μA | 100 MΩ ~ 999.9 MΩ 1.00 GΩ to 99.99 GΩ |
± (20% rdg.) |
| 100 nA≦ I≦ 30 μA | 10.00 MΩ ~ 99.99 MΩ 100.0 MΩ ~ 999.9 MΩ |
± (5% rdg.) |
| 1 μA ≦ I ≦ 300 μA | 1.000 MΩ to 9.999 MΩ 10.00 MΩ ~ 99.99 MΩ |
±(2% rdg. + 5 dgt.) |
| 10 μA ≦ I ≦ 3 mA | 100.0 kΩ to 999.9 kΩ 1.000 MΩ to 9.999 MΩ |
±(1.5% rdg. +3 dgt.) |
| 100 μA ≦ I ≦ 20 mA | 100.0 kΩ to 999.9 kΩ | ±(1.5% rdg. +3 dgt.) |
| Notes (*2) | - Measurement accuracy of ±10% when the test voltage is 50 V to 99 V.
- Measurement accuracy of ±5% when the test voltage is 100 V to 999 V. - Measurement accuracy of ±2% when the test voltage is 1000 V to 2000 V. - Ambient temperature t less than 5°C plus measuring current I < 100 nA:±(5% rdg.×(5-t ) ), or plus measuring current I≧100 nA:±(1% rdg.×(5-t ) ) - Ambient temperature t over 35°C plus measuring current I < 100 nA:±(5% rdg.×(t-35 ) ), or plus measuring current I≧100 nA:±(1% rdg.×(t-35 ) ) - Measurement accuracy is doubled when the measurement speed is FAST2 |
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