Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
TH2826 series component tester is a new generation of impedance testers conforming to LXI standards. Its basic accuracy of 0.1% and frequency range of 20Hz to 5MHz can meet the requirements of component and material measurements, and it can be used to measure low ESR capacitors and high Q inductors. It can be used to analyze a wide range of electrical properties such as microphones, resonators, inductors, ceramic capacitors, liquid crystal displays, varactor diodes, and transformers.
The TH2826 series is a powerful tool for electronic component design, inspection, quality control and production testing. The ultra-high speed of the TH2826 series is especially suitable for automatic production line inspection machines, frequency response curve analysis of piezoelectric devices, etc. Its multiple output impedance modes can be adapted to the different standard requirements of various inductor and transformer manufacturers. With a variety of output impedance modes to suit the different standards of inductive transformer manufacturers, the TH2826 series offers excellent performance for testing to commercial and military standards such as IEC and MIL.
| test parameter | c,l,r,z,y,x,b,g,d,q,theta,dcr | |
| Test Frequency | TH2826A | 20 Hz to 2MHz in 10mHz steps |
| Test Signal Level | f≤1MHz | 10mV～5V,±(10%+10mV) |
| f>1MHz | 10mV～1V,±(20%+10mV) | |
| Output Impedance | 10Ω, 30Ω, 50Ω, 100Ω | |
| Fundamental Accuracy | 0.1% | |
|
Display range
|
L | 0.0001 uH to 9.9999kH |
| C | 0.0001 pF to 9.9999F | |
| R,X,Z,DCR | 0.0001 Ω to 99.999 MΩ | |
| Y, B, G | 0.0001 nS to 99.999 S | |
| D | 0.0001 to 9.9999 | |
| Q | 0.0001 to 99999 | |
| θ | -179.99° to 179.99°. | |
| Measurement speed | Fast: 200 times/s(f﹥30kHz) ,100 times/s(f﹥1kHz) Middle speed: 25 times/s, Slow speed: 5 times/s | |
| calibration function | Open/Short Spot, Sweep Zero, Load Calibration | |
| equivalence mode | Series Connection, Parallel Connection | |
| Measurement range | Automatic, Hold | |
| Display mode | Direct reading, Δ, Δ% | |
| trigger method | Internal, Manual, External, Bus | |
| Internal DC bias | Voltage Mode | -5V to +5V, ±(10%+10mV), 1mV step |
| source | Current mode (internal resistance of 50Ω) | -100mA to +100mA, ±(10%+0.2mA),20uA step |
| Comparator Functions | 10-speed sorting and counting function | |
| monitor (computer) | 320 x 240 dot matrix graphic LCD display | |
| memory (unit) | 20 sets of instrument settings can be saved | |
|
connector |
USB DEVICE (USBTMC and USBCDC support) | |
| USB HOST (FAT16 and FAT32 support) | ||
| LAN (LXI class C support) | ||
| RS232C | ||
| HANDLER | ||
| GPIB (option) | ||
■ Measurement frequency: 20Hz ~ 2MHz, resolution: 10mHz step
■ Basic accuracy: 0.1%
■ Measuring speed: 200 times/s
■ Impedance analysis and testing of piezoelectric ceramics, ultrasonic transducers and other devices
■ Multi-parameter and multi-frequency list scanning function.
■ Test level 10mV to 5V, 1mV steps
■ 320 x 240 dot matrix large graphic LCD display
■ Five-digit readout resolution
■ 22 combinations of impedance parameters can be measured
■ Output impedance of four signal sources
■ 10-point list scan test function
■ Internal self-contained DC bias source
■ External bias source to 40A (option)
■ Automatic leveling (ALC) function for voltage or current
■ V, I test signal level monitoring function
■ Graphic scanning analysis function
■ 20 sets of internal instrument settings for storage/reading
■ Built-in comparator, 10-speed sorting and counting function
■ Multiple communication interfaces for user-friendly on-line use
■ 2m/4m test cable extension (option)
■ Selectable operation interface in Chinese and English
Automatic upgrading of the instrument's operating program via USB HOST is possible.
■ passive component
Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, and network components, etc.
■ semiconductor element
Test and analysis of parasitic parameters of LED driver integrated circuits; C-VDC characteristics of varactor diodes; analysis of parasitic parameters of transistors or integrated circuits
■ other components
Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
■ medium material
Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials
■ magnetic material
Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials
■ semiconductor material
Dielectric constant, electrical conductivity and C-V properties of semiconductor materials
■ liquid crystal unit
C-V properties such as dielectric constant, elasticity constant, etc.
| standard equipment | |||||
| Accessory Name | model number | ||||
| fixture (machining) | TH26048 | ||||
| short circuit board | TH26010 | ||||
| Boxed Four-Ended Insulated Locking Kelvin Test Leads | TH26011BS | ||||
