TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge
TH2840A Precision LCR Digital Bridge

TH2840A Precision LCR Digital Bridge

TH2840 series LCR digital bridge is a new generation of LCR digital bridge successfully developed by Changzhou Tonghui Electronics with new generation of technology, innovative use of dual-CPU architecture, Linux underlying system, 10.1-inch capacitive touch screen, Chinese and English operation interface, built-in instructions and help and other new generation of technology, to solve the previous slow LCR test speed, display a single, cumbersome operation and so on. Deficiencies.

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■ TH2840 series LCR digital bridge is a new generation of technology adopted by Changzhou Tonghui Electronics.

A new generation of LCR digital bridges has been successfully developed with an innovative dual-CPU architecture,

Linux underlying system, 10.1-inch capacitive touch screen, Chinese and English operation interface, built-in enable

The new generation of technology, such as instructions and help, solves the problem of slow LCR test speed, single display, and the need for a new test.

I. Cumbersome operation and other defects.

The TH2840 series LCR digital bridge is designed for frequencies from 20Hz-500kHz/2MHz.

Compensates for the lack of high performance bridges in the 500kHz frequency range.

Thanks to a 10.1-inch capacitive touchscreen with a resolution of 1280*800, the

The TH2840 series LCR digital bridge utilizes a four-parameter display, all settings, and monitoring,

Sorting parameters, status, etc. can be displayed on the same screen, avoiding the tedious operation of frequent switching.

Make.

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A.10.1-inch large screen with four measurement parameters for details at a glance

10.1-inch touch screen, 1280 * 800 resolution, Linux system, Chinese and English operating interface, support for keyboard, mouse, LAN interface, brings unparalleled operational convenience

Sex.

The large screen offers the added benefit of being able to place four test parameters and sorting parameters, sorting results, function selections, etc. on the same screen and never look crowded.

Crowding and clutter, at the same time can display four kinds of measurement parameters, four kinds of measurement parameters arbitrarily adjustable.

The ease of operation and completeness of the display are readily apparent when compared to earlier LCRs.

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B. Up to 1800 times/second measurement speed

Thanks to the innovative dual-CPU design, where one CPU is responsible for test processing data and the other for displaying data, the TH2840 test speed is up to 1,800 times/second.

High test speeds can greatly improve efficiency in automated production lines.

For part of the need for real-time sampling to reflect the characteristics of the transient changes in the measured part, or to measure the corresponding time of the change process, the TH2840 series of 0.56ms measurement speed can be a perfect solution.

As in the following application, a bias voltage is loaded between two polar plates and the capacitance at both ends varies with the bias voltage.

Record the capacitance C0 when no bias is applied.

Capacitance value during bias rise

Capacitor C1 after bias voltage reaches 20V and stabilized

Calculate the stabilization time Th from C0-C1.

Conventional LCR digital bridges, due to test speed limitations, are unable to reach sampling rates of a few

Almost real-time acquisition, with TH2840 series dual CPU, can observe the change process and calculate in real time.

Out of stabilization time.

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TH2840X Uplink Oscilloscope Real-time Waveform Capture

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Capacitance test CH1: AD pulse (yellow)

Test frequency: 1MHz CH2: DC BIAS on (green)

Range: 100Ω CH4: DC BIAS rising (red)

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Rise instant waveform All waveforms

C.Superb Hardware Configuration

In addition to the dual CPU design, the TH2840 series also enhances other hardware configuration parameters:

1. AC test level is increased to 20Vrms/100mA, which can only be achieved by TH2838H, and the range is wider when testing C-V curve.

2. DC bias is ±40V/±100mA, which is the highest configuration of the same kind of products.

3. Standard with independent 2A DC bias current source, for inductance test within 2A current brings the gospel, support the external TH1778A series expansion to 120A.

4. DCR test level increased to 20V, test mH class and above inductors more quickly and stably accurate.

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D. Improved sorting settings

For previous LCR sorting setups and reference setups

switching back and forth and other overly complex operations, making the

The following improvements have been made to facilitate customer use and setup:

1. Combined nominal and reference value settings

2. As a result of the direct application of the 4-parameter measurement and the

The sub-selection, and therefore the elimination of the subsidiary file, the Deputy Senate

Counting files.

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E.Enhanced list scanning function                                                                                                   F. Powerful graphical interface for analysis

4 measurement parameters can be set, 4 measurement parameters have independent switches, list sweep 4 scanning tracks, 1-4 test parameters can be selected arbitrarily, the scanning curve can be

The frequency, level, bias, function and delay time of each point can be set independently to meet the requirements of split-screen, two-screen and four-screen.

most of our customers' needs.

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G. 10-speed sorting and programmable HANDLER interface

The instrument provides 10 grades of sorting, which provides the customer with the possibility to grade the quality of the product How to configure the HANDLER interface when connecting to automation equipment

The TH2840 series of LCRs will be able to output the sorting results directly to the HANDLER interface. output, which has always been a problem for automation customers, the TH2840 series LCR will

HANDLER interface pinout, input/output mode, corresponding signal, answer mode

etc. are fully visualized, making automated connections easier.

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H.Intelligent firmware upgrade method

The instrument itself can be updated by upgrading the firmware without returning to the factory for function improvement, bug solution, function upgrade, and so on.

TH2840 series LCR digital bridge firmware upgrade is very intelligent, can be carried out through the system setup interface or file management interface, intelligent search instrument memory, external USB flash drive

Even LAN upgrade packages with automatic upgrades.

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I. Optional accessories

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Product Model TH2840A TH2840B
 

demonstrate

monitor (computer) 10.1-inch capacitive touch screen
proportions 16:9
resolution (of a photo) 1280×RGB×800
 

measured parameter

way (of life) Four parameters can be selected arbitrarily
AC Cp/Cs, Lp/Ls, Rp/Rs, |Z|, |Y|, R, X, G, B, θ, D, Q, VAC, IAC
DC RDC, VDC, IDC
 

 

 

 

 

 

Test Frequency

realm 20Hz-500kHz 20Hz-2MHz
accurate 0.01%
 

 

 

 

resolution (of a photo)

0.1mHz (20.0000Hz-99.9999Hz)
1mHz (100.000Hz-999.999Hz)
10mHz (1.00000kHz-9.99999kHz)
100mHz (10.0000kHz-99.9999kHz )
1Hz (100.000kHz-999.999kHz)
10Hz (1.00000MHz-2.00000MHz)
 

AC Test Signal Mode

Rated value (ALC OFF) The set voltage is the Hcur voltage when the test terminal is open circuit
The set current is the current from Hcur when the test terminal is short-circuited.
Constant value (ALC ON) Keep the voltage on the DUT the same as the set value
Keep the current on the DUT the same as the set value
 

 

 

 

 

 

 

 

 

test level

voltage range 5mVrms-20Vrms F≤1MHz 5mVrms-20Vrms

F>1MHz 5mVrms-15Vrms

accuracy ± (10% x setpoint + 2mV) (AC ≤ 2Vrms)

± (10% x setpoint + 5mV) (AC > 2Vrms)

 

 

 

resolution (of a photo)

1mVrms (5mVrms-0.2Vrms)
1mVrms (0.2Vrms-0.5Vrms)
1mVrms(0.5Vrms-1Vrms)
10mVrms (1Vrms-2Vrms)
10mVrms (2Vrms-5Vrms)
10mVrms (5Vrms-10Vrms)
10mVrms(10Vrms-20Vrms)
current range 50μArms-100mArms
 

 

Resolution (100Ω internal resistance)

10μArms (50μArms-2mArms)
10μArms (2mArms-5mArms)
10μArms (5mArms-10mArms)
100μArms (10mArms-20mArms)
100μArms (20mArms-50mArms)
100μArms (50mArms-100mArms)
 

 

RDC Testing

voltage range 100mV-20V
resolution (of a photo) 1mV(0V-1V)
10mV(1V-20V)
current range 0mA-100mA
resolution (of a photo) 10μA(0mA-10mA)
100μA (10mA-100mA)
 

 

 

DC Bias

voltage range 0V-±40V
accuracy AC≤2V 1%×set voltage+5mV
AC>2V 2% x set voltage +8mV
resolution (of a photo) 1mV(0V-1V)
10mV (±1V- ±40V)
current range 0mA-±100mA
resolution (of a photo) 10μA(0mA-10mA)
100μA (10mA-100mA)
Built-in current source current range 0mA-2A
accuracy I>5mA ± (2% x setpoint + 2mA)
resolution (of a photo) 1mA
Test Side Configuration hand in hand with
Test cable length 0m, 1m, 2m, 4m
Output Impedance 30Ω, ±4%@1kHz
100Ω, ±2%@1kHz
mathematical operation Absolute deviation from nominal value Δ, percentage deviation from nominal value Δ%
equivalence mode Series, parallel
calibration function Open OPEN, Short SHORT, Load LOAD
Measured average 1-255 times
Range Selection Auto AUTO, Manual HOLD
Range Configuration LCR 100mΩ, 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
RDC 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
 

Measurement time (ms)

Fast+:0.56ms

Fast:3.3ms

Medium speed: 90ms

Slow: 220ms

Maximum accuracy 0.05% (refer to specifications)
Measurement display range
Cs, Cp 0.00001pF-9.99999F
Ls, Lp 0.00001μH-99.9999kH
D 0.00001-9.99999
Q 0.00001-99999.9
r, rs, rp, x, z, rdc 0.001mΩ-99.9999MΩ
G, B, Y 0.00001μs-99.9999S
VDC ±0V-±999.999V
IDC ±0A-±999.999A
θr -3.14159-3.14159
θd -179.999°-179.999°
Δ% ± (0.000%-999.9%)
 

 

 

Multi-function parameter list scanning

check numbers 201 points, each point can be set the average number of times, each point can be separate sorting
parameters Test Frequency, AC Voltage, AC Current, DC BIAS Voltage, DC BIAS Current (100mA), DC BIAS Current (2A)
 

Trigger Mode

Sequential SEQ: When triggered once, measurements are taken at all scan points, /EOM/INDEX is output only once
Step STEP: Performs one scan point measurement per trigger and outputs /EOM/INDEX at each point, but list scan comparator results are only output at the last /EOM
Other features 1. Scanning parameters and test parameters have a variety of copy functions

2. Each scanning point can be set up delay time

comparator Each scanning point can measure up to four test parameters, each parameter can be set upper and lower limits, all test parameters are qualified to output PASS signal, otherwise output FAIL signal, not set upper and lower limits are not judged
 

 

 

 

Graphic Scanning

Scanning Points Points 51, 101, 201, 401, 801 are optional
The results show that Extreme values for each parameter and the scanned parameter value at the point where the cursor is located with the corresponding test parameter value
scanning track 1-4 test parameters can be selected arbitrarily, and the scanning curve can be divided into one screen, two screens and four screens.
Display range Real-time automatic, locked
coordinate scale Logarithmic, linear
scanning parameter Frequency, AC voltage, AC current, DCV BIAS / DCI BIAS(100mA) / DCI BIAS(2A)
trigger method one-off Trigger manually once, one scan from start to finish is completed, the next trigger signal starts a new scan
progression Infinite loop scanning from start to finish
Results Saving Graphics, documentation
 

 

 

comparator

Bin Staging 10Bin, PASS, FAIL
Bin deviation setting Deviation value, percent deviation value, off
Bin mode Tolerance, continuous
Bin Count 0-99999
grade differentiation Each file can set up to four parameter limit range, four test parameter results within the set file display corresponding file number, beyond the set maximum file number range will display FAIL, not set the upper and lower limits of the test parameters are automatically ignored file discrimination
PASS/FAIL indication If Bin1-10 is met, the front panel PASS light is on, otherwise the FAIL light is on.
data cache 201 measurements can be read in batches
store a call (computing) inside (part, section) Approx. 100M non-volatile memory test setup file
External USB Test setup files, screenshot graphics, log files
Keyboard Lock Lockable front panel keys, other functions to be expanded
 

 

 

 

connector

USB HOST 2 USB HOST ports, can be connected to the mouse, keyboard, U disk at the same time can only use a
USB DEVICE Universal Serial Bus socket, small Class B (4 contact positions); USB TMC-USB488 and USB2.0 compliant, female connector for connection to external controller.
LAN 10/100M Ethernet Adaptive
HANDLER For Bin Staging Signal Output
External DC BIAS control Support TH1778A
RS232C Standard 9-pin, Crossed
RS485 Accept conversion or external RS232 to RS485 module
Power-on warm-up time 60 minutes.
Input Voltage 100-120VAC/198-242VAC selectable, 47-63Hz
power wastage Not less than 130VA
Dimensions (WxHxD) mm3 430x177x265
Weight (kg) 11kg

■ High resolution: 10.1 inches, resolution 1280*800, capacitive touch screen

■ High stability and consistency: 14 range configurations

■ High power: signal level: 20V/100mA

Built-in DC bias: ±40V/100mA

Built-in bias current source: 2A

■ DCR level: 20V/100mA

■ High speed: dual CPU architecture, the fastest test speed up to 1800 times / s

■ Three types of tests: point test, list scan, and graphic scan

■ Four-parameter measurements

■ 201-point multi-parameter list scanning function

■ Graphic scanning function, 4 tracks optional, support 1/2/4 split screen

■ Sorting function: LCR mode 10-speed sorting

■ High compatibility: supports the SCPI/MODBUS command set.

Compatible with KEYSIGHT E4980A, E4980AL, HP4284A

■ Passive components:

Capacitors, Inductors, Cores, Resistors, Piezoelectric Devices, Transformers, Chip Assemblies and

Evaluation of impedance parameters and performance analysis of network components, etc.

■ Semiconductor components:

Test and analysis of parasitic parameters of LED driver integrated circuits; C-VDC characteristics of varactor diodes

Sex; Parasitic parameter analysis of transistors or integrated circuits

■ Other components:

Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.

■ Medium material:

Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials

■ Magnetic materials:

Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials

■ Semiconductor materials:

Dielectric Constant, Conductivity and C-V Characteristics of Semiconductor Materials Liquid Crystal Materials: Liquid Crystal Units of

C-V properties such as dielectric constant, elasticity constant, etc.

■ Various sensors.

Electronic skin, galvanometer image filter array sensor

standard equipment
Accessory Name model number
Boxed Four-Ended Insulated Locking Kelvin Test Leads TH26011BS
fixture (machining) TH26048
short circuit board TH26010

 

optional
Accessory Name model number
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TH2840A Precision LCR Digital BridgeTH2840A Precision LCR Digital Bridge

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