Comprehensive test and measurement service provider-Shenzhen Weike Electronic Technology Co.
Parameters are viewed quickly and clearly.
Advancing bold discoveries has never been easier. the 4200A-SCS Parameter Analyzer reduces time from setup to running calibration tests by up to 50%, enabling unmatched measurement and analysis capabilities. In addition, embedded measurement expertise provides unparalleled test guidance and keeps you informed about the final results.
specificities
- Advanced measurement hardware for DC IV, CV and Pulse IV measurement types
- Start testing today with hundreds of user-modifiable application tests included in the Clarius software!
- Automatic real-time parameter extraction, data plotting, analysis functions
Accurate C-V characterization
Measure single-digit flying methods with Keithley's newest Capacitance-Voltage Unit (CVU), the 4215-CVU. By integrating a 1 V AC power supply into Keithley's industry-leading CVU architecture, the 4215-CVU enables low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
specificities
- One CV meter in its class capable of driving 1 V AC supply voltage
- 1 kHz frequency with resolution from 1 kHz to 10 MHz
- Measurement of capacitance, conductivity and admittance
- Measure up to four channels with the 4200A-CVIV Multiswitch
Measure, switch, repeat.
The 4200A-CVIV multi-channel switching module automatically switches between I-V and C-V measurements without rewiring or lifting the probe end. Unlike competitive products, the four-channel 4200A-CVIV display provides local visual viewing for quick test setup and easy troubleshooting when unexpected results occur.
specificities
- Move C-V measurements to any device terminal without rewiring
- User configurable low current function
- Personalized output channel names
- View real-time test status
Stable low-current measurement for I-V checking
With the 4201-SMU and 4211-SMU modules, you can achieve stable low-current measurements in high-capacitance systems. 4200A-SCS is available in a choice of four models of Source Measurement Units (SMUs) that can be customized to meet all of your I-V measurement needs. By offering field installable units and optional pre-amplifier modules, Keithley ensures you get accurate low current measurements with little or no downtime.
specificities
- Increase SMU without sending the instrument back to the factory
- Perform safety-on-the-fly measurements.
- Up to 9 SMU channels
- Optimized for long cables or large chucks
Integrated solution with analytical detector and cryogenic controller
The 4200A-SCS Parametric Analyzer supports many manual and semi-automatic wafer detectors and cryogenic controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryostat.
specificities
- "Click" test sequencing
- "Manual" detector mode to test detector functions
- False detector mode enables debugging without removing commands
| model number | descriptive |
| 4200A-SCS-PKA High Resolution IV Kit |
4200A-SCS: Parameter Analyzer Mainframe |
| 4201-SMU: two medium-power SMUs for high-capacity setups | |
| 4200-PA: a preamplifier | |
| 8101-PIV: A test fixture with sampling device | |
| 4200A-SCS-PKB High Resolution IV and CV Kits |
4200A-SCS: Parameter Analyzer Mainframe |
| 4201-SMU: two medium-power SMUs for high-capacity setups | |
| 4200-PA: a preamplifier | |
| 4215-CVU: a high-resolution multi-frequency C-V unit | |
| 8101-PIV: A test fixture with sampling device | |
| 4200A-SCS-PKC High Power IV and CV Kits |
4200A-SCS: Parameter Analyzer Mainframe |
| 4201-SMU: two medium-power SMUs for high-capacity setups | |
| 4211-SMU: two high-power SMUs for high-capacity setups | |
| 4200-PA: two preamplifiers | |
| 4215-CVU: a high-resolution multi-frequency C-V unit | |
| 8101-PIV: A test fixture with sampling device | |
| 4200-BTI-A Ultra-fast NBTI/PBTI kit |
For complex NBTI and PBTI measurements using state-of-the-art silicon CMOS technology The 4200-BTI-A kit includes: |
| 1 4225-PMU Ultra-Fast I-V Module | |
| 2 4225-RPM Remote Preamplifier/Switch Modules | |
| Automated Calibration Suite (ACS) Software | |
| Ultra-Fast BTI Test Program Module | |
| cabling |
| descriptive | Configurations and offers |
| 4200-SMU | Medium Power Source Measurement Units |
| 4200-BTI-A | Ultra-Fast BTI Package |
| 4200-PA | Remote Preamplifier Module |
| 4200A-CVIV | IV CV test toggle switch |
| 4201-SMU | Medium Power Source Measurement Unit |
| 4210-SMU | High Power Source Measurement Unit |
| 4211-SMU | High Power Source Measurement Unit |
| 4215-CVU | Capacitor voltage CV measurement unit |
| 4220-PGU | High voltage pulse generator unit |
| 4225-RPM | Remote preamplifier/switching module |
| 4225-PMU | Ultra-fast pulse IV measurement unit |
Biosensor calibration
A biosensor or bioFET converts the biological response to an analyte into an electrical signal. The Clarius software integrated into the 4200A-SCS includes a project for testing bioFETs. Use this as a starting point to characterize the transmission and output of the biosensor and work from there.
Measurement of femtocapacitance
Measure sub-microfarad capacitance with the 4215-CVU module. By driving 1 V AC, the noise level of the 4215-CVU can be as low as 6 attofarad when measuring 1 fF capacitors.This is just one of dozens of applications for measuring capacitance and extracting important parameters that come with the Clarius software.
Femtofarad (1e-15F) Capacitance Measurements with the 4215-CVU
Performs optimal capacitance and AC impedance measurements
specificities
- Built-in Flying Method Measurement Function
- 10,000 frequency steps from 1kHz to 10MHz
- Customize any test for any device using the user library
Semiconductor and NVM Reliability
Take advantage of new technologies in testing with comprehensive pulse I-V checks. The 4200A-SCS provides support and ready-to-use testing for the latest NVRAM technologies, from floating gate flash to ReRAM and FeRAM. Dual source and measure functions for current and voltage support both transient and I-V domain calibrations.
Evaluating Hot Carrier Induction Degradation in MOSFET Devices
Single Nanosecond Pulse Solution for Non-Volatile Memory Testing
Non-volatile memory technology pulse I-V Accreditation
Provides C-V measurements for high impedance applications
Analyze the capacitance of high-resistance samples using Keithley's custom very-low-frequency C-V technique. This technique can be applied by using only the Source Measurement Unit (SMU) instrument and can be combined with the 4210-CVU to perform higher frequency measurements.
4200A-SCS Parameter Analyzer Performs Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices
Tips and Techniques to Simplify MOSFET/MOSCAP Device Calibration
specificities
- .01 ~ 10 Hz frequency range, 1 pF ~ 10 nF sensitivity
- 3½-bit typical resolution, 10 fF minimum typical value
Testing when using long cables or capacitive fixtures
Use the 4201 or 4211-SMU when testing requires very long cables or fixtures with high capacitance These SMUs are great for connecting LCD test stations, detectors, switching matrices, or any other large or complex tester. Field installable versions allow you to add capacity without having to return the unit to a service center.
Stable low-current measurements with high test connection capacitance using the 4201-SMU and 4211-SMU
material resistivity
Using the 4200A-SCS with integrated SMU, resistivity can be easily measured with a four-point coaxial probe or the Vanderbilt method. Included tests automatically repeat Vanderbilt calculations, saving you valuable research time. Maximum current resolution of 10aA and input impedance greater than 1016 ohms provide more accurate and precise results.
4200A-SCS parametric analyzer and four-point coaxial probe can be used to perform semiconductor material resistivity measurements
4200A-SCS parameter analyzer can be used to perform Vanderbilt and Hall voltage measurements
MOSFET Accreditation
The 4200A-SCS houses all the instruments necessary to perform a comprehensive MOS device qualification through component or wafer testing. Included tests and programs address MOSCap oxide thickness, threshold voltage, doping concentration, mobile ion concentration, and more. All of these tests can be run at the touch of a button in an instrument box.
The 4200A-SCS parameter analyzer can be used to perform MOS capacitor C-V checks.
hardware
Automation control from lab to fab
Keithley Automated Checkout Suite (ACS) gives you complete control of your equipment. Whether you need to control a few instruments on the bench or automate an entire test rack for production, ACS provides a flexible, interactive environment for equipment calibration, parametric testing, reliability testing, and simple functional testing.
- Perform simple one-off tests or build complex project trees
- Code in ACS with Python for Unlimited Flexibility and Control
- Manual or automatic wafer detector control
- Data management and statistical analysis functions
Clarius+ Analysis Kit
With the Clarius+ software suite, you can easily gain insight into the calibration of materials and equipment.Clarius runs locally on the 4200A-SCS and allows you to plan, configure and analyze test results. In addition, Clarius can be installed on any Windows 10 PC to plan and configure tests before running them in the lab, or to analyze data after it has been collected.
- Over 200 pre-configured tests to speed up lab operations
- Real data carefully collected by Keithley engineers
- Built-in contextual help and application guides
- Provides monitoring mode for real-time viewing of results
