Prosser Solutions

  • Simplifying Pressure Sensor Characterization Testing with Digital Source Meter (SMU)

    Pressure Transducer Characterization Focus on semiconductor electrical performance testing Pressure Transducer Classification Pressure Transducer (Pressure Transducer) is able to feel the pressure signal, and in accordance with certain laws will be able to convert the pressure signal into a usable output of electrical signals of the device or device, pressure sensors ...

  • Simplifying Gas Sensor Characterization Testing with Digital Source Meter (SMU)

    Sensors Specializing in Semiconductor Electrical Performance Testing Overview A gas sensor is a device that converts certain information about a gas, including its concentration and type, into acoustic, electrical, optical, or digital information that can be utilized by an operator, instrument, computer, etc., and is usually installed in a monitoring system...

  • Prosser's high precision digital source meter (SMU) builds flexible material and device test system

    Materials Research Focusing on Semiconductor Electrical Performance Testing Overview:Flexible Electronic Materials and Their Applications Flexible electronics is the technology of attaching inorganic/organic devices to flexible substrates to form circuits. In contrast to conventional silicon electronics, flexible electronics is a technology that can be bent, folded, twisted, stretched, and even deformed into...

  • Application of Digital Source Meter on I-V Characterization of Solar Cells

    Materials Research Specializing in Semiconductor Electrical Performance Testing Solar cells, also called photovoltaic cells, have three main parts of the power generation process: first, the semiconductor material absorbs the light energy to produce a non-equilibrium electron-hole pair or dipole; second, the non-equilibrium electrons and holes move from the generation place to the potential field, and this movement can be a diffusion operation...

  • Memristor Basic Performance Research Test Solution Based on Purcell Digital Source Meter (SMU)

    Memristor basic performance research specializing in semiconductor electrical performance testing Based on the classical circuit theory, there are four basic circuit physical quantities, namely, current (i), voltage (v), charge (q) and magnetic flux (o). According to these four basic physical quantities, six mathematical relationships can be derived theoretically, while defining three basic...

  • Parametric testing of Prosser GaN HEMT RF devices

    GaN HEMT RF Device Parameter Test Focus on Semiconductor Electrical Performance Test Overview-RF RF device is the realization of the signal transmission and reception of the basic components, is the core of wireless communications, mainly including filters (Filter), power amplifiers (PA), RF switches (Switch), low-noise amplifiers (...

  • Photodetector Electrical Performance Parameter Testing

    For photodetector single sample testing and multi-sample verification testing, complete test programs can be built directly from a single digital source meter, multiple digital source meters or plug-in source meters.

  • High Power Laser Aging Test System Solution

    High Power Laser Aging Tests Specializing in Semiconductor Electrical Performance Tests High power semiconductor lasers and high power semiconductor laser pumped lasers are used in the civilian fields of material processing, laser marking, laser ranging, laser storage, laser display, laser illumination, laser medical treatment, etc., as well as in laser...

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