Simplifying the Testing of Nanomaterial Electrical Performance Parameters with Digital Source Meter (SMU)


  summarize

        Nanomaterials, defined as a class of ultrafine materials with particle sizes between 1 and 100 nanometers, have some special physicochemical properties, such as surface effect, small size effect, and macroscopic quantum tunneling effect. Due to the large specific surface area, small particle size, and high proportion of surface atoms, nanomaterials have unique properties in electrical, thermodynamic, and catalytic applications. According to the spatial expression of nanometer scale, they can be divided into zero-dimensional nanomaterials, i.e. nanoparticle materials, one-dimensional nanomaterials (such as nanowires, rods, filaments, tubes and fibers, etc.), two-dimensional nanomaterials (such as nanomembranes, nanodiscs, superlattices, etc.), and nanostructured materials, i.e., nanospace materials (such as mesoporous materials, etc.). According to the different functions and applications of nanomaterials, they can be categorized into nanoelectricity generating materials, nanomagnetic materials, nanocatalytic materials, nanosmart materials, nanowave-absorbing materials, nano-thermal sensitive materials and so on.

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Fig. 1:Schematic diagram of nanomaterial structure

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Fig. 2:Classification of nanomaterials

        In the research and development of nanomaterials, it is particularly important to characterize the materials in different dimensions, which is a key link in evaluating the performance of the materials and the research and development process. Common nanomaterial characterizations include structural characterization, compositional analysis, morphological characterization, and performance characterization - optical, electrical, magnetic, thermal, and force. Characterization of electrical properties of nanomaterials means applying pressure, temperature, voltage or current to the manufactured nanomaterials or devices, and testing the changes in electrical parameters, such as current (I), voltage (V), or resistance (Ω) of the samples under different kinds of excitations of different intensities, which can be used to analyze the nanomaterials further.

  • Hall effect test

When a current is passed through a nanomaterial perpendicular to an external magnetic field, the carriers are deflected and an additional electric field is generated perpendicular to the direction of the current and the magnetic field, thus generating a potential difference between the two ends of the semiconductor, a phenomenon known as the Hall effect. The common test method used for Hall effect testing is the Vanderbilt method with an applied magnetic field.

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Figure: Hall effect test system architecture

  • Resistivity Test

        Resistivity testing of 2D nanomaterials (e.g. graphene) is an important test item, and the test methods are mainly four-probe method and Vanderbilt method.

        For regular round material samples, a more convenient method for resistivity testing is the four-probe method, which has the advantage of separating the current and voltage electrodes and eliminating the impedance effects of wiring and probe contact resistance. The Vanderbilt method is a more generalized four-probe measurement technique that has no requirements for sample shape and does not require all dimensions of the sample to be measured.

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Figure: Four-probe test system architecture

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Figure: Vanderbilt Method Test System Architecture

  • High-temperature in situ characterization of nanomaterials

  The high-temperature in-situ characterization system is based on a high-precision digital source table, controlling the MEMS chip in the in-situ sample stage to build a fine thermal field automatic control and feedback measurement system for the samples, and combining with the transmission electron microscope (TEM) to study the structural phase change, morphological change, physical change and electrical change of materials occurring under different thermal field conditions, which is one of the most innovative and promising characterization techniques in the science of nano-materials structural characterization. It is one of the most innovative and promising characterization techniques in the science of nanomaterial structure characterization.

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Fig. In-situ TEM electrical properties characterization

Note: Image from "Phase and polarization modulation in two-dimensional In2Se3 via in situ transmission electron microscopy".

Typical applications and electrical properties of nanomaterialsTest Program

  • Nanoelectrode material application and test characterization
  • Bipolar Plate (BPP) Material Applications and Test Characterization
  • Application of nano-pressure-sensitive ceramic materials and characterization of electrical performance testing
  • Application and Test Characterization of Nano Power Generation Materials
  • Organic Field Effect Transistor Applications and Test Characterization

If you need to get the detailed system construction plan and test line connection guide, welcome to call us for consultation!

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