Overview: Flexible Electronic Materials and Their Applications
Flexible electronics is a technology in which inorganic/organic devices are attached to a flexible substrate to form circuits. In contrast to conventional silicon electronics, flexible electronics refers to thin-film electronic devices that can be bent, folded, twisted, stretched, or even morphed into arbitrary shapes, but still maintain efficient optoelectronic performance, reliability, and integration.
Flexible electronics covers organic electronics, plastic electronics, bio-electronics, nano-electronics, printed electronics, including: RFID, flexible display, organic electroluminescence (OLED) display and lighting, chemical and biological sensors, flexible photovoltaic, flexible logic and storage, flexible batteries, wearable devices and other applications.
Dynamic" Testing of Flexible Electronic Materials
Flexible electronic materials will be repeatedly bent and twisted during the use process, during which the stress state and microstructure on the surface and inside of the material will gradually change, thus affecting the electrical properties and life of the material. The use of repeated bending and twisting to test the fatigue resistance, stability and life decay characteristics of flexible materials has gradually become an indispensable means of characterization of flexible electronic devices.
Difficulties in "dynamic" testing of flexible electronic materials
In order to ensure the normal use of flexible electronics, flexible materials used in the circuit must be a detailed understanding of the electrical properties of flexible materials. Because flexible materials in the deformation of his impedance will change, and the degree of deformation is different, the impedance change is also different. It is necessary to carry out the l-V characteristic test, and real-time monitoring of V-t, l-t and R-t change curve, and in the test, especially pay attention to the synchronization between the flexible material folding device and the I-V test equipment. Traditionally, the electrical characteristics of flexible electronic materials are measured manually, requiring a voltage source, ammeter, and then manually calculate the change in resistance value. And the power supply or multimeter can only be used as a source or table, with each other to complete the l-V measurement, can not meet the test scenarios of multi-purpose machine, but also for the measurement of high precision and folding device synchronization requirements of high precision can not guarantee the scene.
Prossis Flexible Test Systems: Standardized, Efficient "Dynamic" Test Solutions
Purcells Instrumentation together with well-known manufacturers in the industry to create a flexible electronic material testing system, through the combination of different actions of the test fixture, can simulate the twisting, turning, bending, folding, rolling, and other five basic test actions, 11 basic simulation test actions, to achieve a multi-purpose machine, so that the standardization of flexible testing. It can not only test the five basic motions of folding, bending, twisting, pulling and rolling of flexible materials, but also test the I-V characteristics of flexible materials, which is an important test system for the study of flexible materials, and it can greatly improve the development and verification efficiency and reduce the test cost.
Figure: Flexible Test System Fixture
Purcells is deeply engaged in semiconductor I-V test field, has been committed to independent research and development of domestic source meter products, and took the lead in launching the S series of high-precision digital source meter, integrating the functions of voltage, current input/output and measurement, and also can be used as an electronic load to absorb energy. Maximum voltage of 300v, minimum current of 100pA, output accuracy of 0.1%, maximum power of 30W, to achieve fast and accurate measurement of the material's electrical parameters, widely used in printed electrodes, conductive polymers, graphene, sensors, flexible solar cells, OLEDs, and electronic skin, and other flexible electronic materials, such as the l-V characteristics of the test scene.
Flexible Electronic Materials "Static" Testing
Flexible electronic device is a new generation of flexible electronic components that can realize logic amplification, filtering, data storage, sensing and other functions based on flexible electronic materials, combined with micro and nano-processing and integration technologies. Flexible semiconductor devices can be divided into inorganic semiconductor devices, carbon-based semiconductor devices, as well as flexible organic field effect transistors (OFETs) three categories, of which organic field effect transistors due to the following outstanding features by the researchers pay great attention to: a wide range of sources of materials, can be compatible with the flexible substrate, low-temperature processing, suitable for high-volume production and low-cost, etc., can be used in the memory components, sensors, organic lasers, superconducting materials preparation. They can be used in memory components, sensors, organic lasers, superconducting materials preparation, etc.
Organic field effect transistor (OFET) is through the electric field to regulate the conductivity of organic semiconductor layer of active devices, by the three electrodes that is the source (source), drain (drain), gate (gate), organic semiconductor layer and gate insulating layer, the typical structure for the top contact class and bottom contact class, of course, there are atypical structures such as double active layer class or double insulating layer class. The test of organic field effect transistor (OFET) mainly includes l-V test and C-V test.
Figure: Organic Field Effect Transistor (OFET) Structure
Figure : Organic Field Effect Transistor (OFET) I-V Curve
I-V testing
I-V testing is one of the main methods used to extract key parameters of a device, to study the effects of the manufacturing process, and to determine the quality of the contacts. It includes input/output characteristics test, threshold voltage test, breakdown test and leakage current test.
Purcells S or P series of high-precision digital source meters, voltage, current input and output and measurement functions in one, but also can be used as an electronic load to absorb energy. Maximum voltage of 300v, minimum current of 10pA, output accuracy of 0.1%, maximum power of 30W, to achieve fast and accurate measurement of the material's electrical parameters, widely used in printed electrodes, conductive polymers, graphene, sensors, flexible solar cells, OLEDs, and electronic skin, and other flexible electronic materials, the I-V characteristics of the test scene.
Input/Output Characterization Test
OFET is a gate voltage control source leakage current device, in a fixed leakage voltage, can be measured under a IDs ~ VGs relationship curve, corresponding to a set of stepped leakage voltage can be measured ━ cluster of dc input characteristic curve. OFET in a fixed gate voltage obtained under the relationship between the IDs ~ VDs that is, the dc output characteristics, corresponding to a set of stepped gate voltage can be measured as a cluster of output characteristic curve.
Threshold voltage VGs(th)
VGs(th) is the value of VGs at which the gate source voltage can cause current to start at the drain; the
Leakage Current Test
lGss (gate source leakage current) is the leakage current flowing through the gate at a specified gate voltage; lDss (zero gate voltage drain current) is the leakage current between DSs at a specified Vos when VGs=0; lDss (zero gate voltage drain current) is the leakage current between DSs at a specified Vos.
Pressure resistance test
VDss (drain source breakdown voltage): is the Vos value when lo starts to increase dramatically during the process of increasing the drain source voltage under the condition of VGs = 0.
C-V Testing
C-V measurements are commonly used to monitor the manufacturing process of OFETs. By measuring the C-V curves of OFET capacitors at high and low frequencies, parameters such as the gate oxide thickness, tox, oxide charge and interface state density, Dit, flat-band voltage, Vfb, and doping concentration in the silicon substrate, etc., can be obtained. Generally, the test includes Ciss (input capacitance), Coss (output capacitance) and Crss (reverse transfer capacitance). The common test method is to apply a DC bias voltage between the collector and the emitter stage under the condition of VGE=0, and at the same time use an AC signal (the frequency is generally between 10KHz and 1MHz) for measurement.
Resistivity Testing of Flexible Film Materials
Thin film is a two-dimensional material, it is in the thickness direction of the size is very small, often for the nanometer to micron scale, electronic semiconductor functional devices and optical coating is the main application of thin film technology. Thin film materials can be divided into non-electronic thin film materials and electronic thin film materials, electronic thin film materials can be divided into semiconductor films, dielectric films, resistive films, optoelectronic films, etc., the surface resistivity of electronic thin film materials is more important electrical parameters.
A common method of surface resistivity is the four-probe method. Four-probe test method is simply put four probes placed equidistant from each other on the sample, the outer two probes to provide current, the inner two probes to test the voltage, and then through the measured data to calculate the resistivity; with the source of the table and the probe table can be manually or write software to automatically complete the test.
Purcells S/P series high precision digital source meter integrates the functions of voltage, current input/output and measurement. Maximum voltage 300V, minimum current 10pA, output accuracy up to 0.1%, with a third-party probe stage, to meet the needs of different electronic thin film material resistivity testing, while providing SPI programming instruction set, convenient to write software for automatic testing.
Wuhan Purcells has been focusing on the development of semiconductor electrical performance test instrumentation, based on the core algorithms and system integration and other technology platform advantages, the first independent research and development of high-precision digital source meter, pulse source meter, narrow pulse source meter, integrated plug-in source meter and other products, which are widely used in the field of semiconductor device and material analysis and testing.For more flexible materials and devices test system construction program and test line connection guide, welcome to call us for more information.
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